Test-driven Development to Overcome Challenges in the Design of Sensor-integrating Machine Elements

DS 119: Proceedings of the 33rd Symposium Design for X (DFX2022)

Year: 2022
Editor: Dieter Krause, Kristin Paetzold, Sandro Wartzack
Author: Julian Peters (1), Christoph Zimmerer (1), Thomas Gwosch (1), Felix Herbst (2), Claas Hartmann (2), Romol Chadda (2), David Riehl (3), Ferdinand Keil (3), Mario Kupnik (2), Klaus Hofmann (3), Sven Matthiesen (1)
Series: DfX
Page(s): 10
DOI number: 10.35199/dfx2022.12


Sensor-integrating machine elements (SiME) are essential enablers for digitization in the industry. There are major challenges in the development of SiME as an interdisciplinary mechatronic system, requiring methodical support. In this work, we address these challenges and aim to provide methods and tools by analyzing the state-of-the-art and ten ongoing projects of sensor integration in machine elements. Clustering shows similarities for example in the identification of design space or weakening of the structure. Based on this, a test-driven development process with a focus on interdisciplinary negotiations and iterations is described to overcome the challenges in developing SiME.

Keywords: Sensor integration, machine element, method, support, testing


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